Jump to main content
Prof. Shun MUTO's Group: Advanced Measurement Technology Center, Institute of Materials and Systems for SustainabilityJapaneseEnglish
物質科学専攻 ナノ解析物質設計学 ナノ顕微分光物質科学
(旧 量子エネルギー工学分野 エネルギー材料物性工学)

Publications

under construction...

2021
2020
2019
2018
2017
2016
2015
2014
2013
2012
2011
2010
2009
2008
2007
2006
2005
2004
2021
Peer-reviewed

[1]  C. Takahashi, S Yamada, S. Yagi, T. Murai, S. Muto, “Preparation of silver-decorated Soluplus® nanoparticles and antibacterial activity towards S. epidermidis biofilms as characterized by STEM-CL spectroscopy” Materials Science & Engineering C, 121, 11718 (2021)

[2]  A. Yamakata, J. J. M. Vequizo, T. Ogawa, K. Kato, S. Tsuboi, N. Furutani, M. Ohtsuka, S. Muto, A. Kuwabara, Y. Sakata, “Core−Shell Double Doping of Zn and Ca on β- Ga2O3 Photocatalysts for Remarkable Water Splitting” ACS Catalysis, 11, 1911-1919 (2021)

[3]  M. Ohtsuka, K. Oda, M. Tanaka, S. Kitaoka, S. Muto, “2D-HARECXS analysis of dopant and oxygen vacancy sites in Al-doped yttrium titanate” Journal of the American Ceramic Society, 104, 3760–3769 (2021) DOI:10.1111/jace.17764

[4]  M. Ohtsuka, S. Muto, “Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis” JoVE Journal, (2021) https://www.jove.com/v/62015

[5]  H. Tanaka, K. Orita, A. Maede, H. Ishikawa, M. Miura, S. Arai, T. Higuchi, S. Ohta, S. Muto, “Dynamics of Rh Nanoparticle Surface Structure during NO Reduction Revealed by Operando Transmission Electron Microscopy; Applied Catalysis A: General, online, 118334 (2021)
https://doi.org/10.1016/j.apcata.2021.118334

[6]  Y. Igami, S. Muto, A. Takigawa, M. Ohtsuka, A. Miyake, K. Suzuki, K. Yasuda, A. Tsuchiyama, “Structural and chemical modifications of oxides and OH generation by space weathering: Electron microscopic/spectroscopic study of hydrogen-ion-irradiated Al2O3” Geochimica et Cosmochimica Acta, 315, 61-72 (2021) https://doi.org/10.1016/j.gca.2021.09.031

Books, commentaries and reviews, etc.

[1]      武藤俊介, 志賀元紀, ”次元削減法とそのスペクトル解析への応用”,ふぇらむ, 26, 7, 32-40 (2021)

2020
Peer-reviewed

[1]  T. Yamada, M. Ohtsuka, Y. Takahashi, H. Yoshino, S. Amma, S. Muto, “Measurement of nanoscale local stress distribution in phase-separated glass using scanning transmission electron microscopy-cathodoluminescence ” Materialia, 9, 100578 (2020)

[2]  F. Gaulandris, S. B. Simonsen, J. B. Wagner, K. Mølhave, S. Muto, L. T. Kuhn, “Metohods for calibration of specimen temperature during in situ transmission electron microscopy experiments” Microscopy and Microanalysis, 26, 3-17 (2020)

[3]  S. Muto, M. Shiga, “Application of machine learning techniques to electron microscopic/spectroscopic image data analysis” Microscopy, 69, 110-122 (2020) DOI:10.1093/jmicro/dfz036

[4]  H.-K. Tian, R. Jalem, B. Gao, Y. Yamamoto, S. Muto, M. Sakakura, Y. Iriyama, Y. Tateyama, “Electron and Ion Transfer across Interfaces of NASICON-type LATP Solid Electrolyte with Electrodes in All-Solid-State Battery: A DFT Study via Explicit Interface Model” ACS Applied Materials & Interfaces, accepted (2020)

Books, commentaries and reviews, etc.

[1]      志賀元紀, 武藤俊介, ”統計的機械学習に基づく低カウントのスペクトルイメージ解析”,電気化学, 88, 42-46 (2020)

[2]      武藤俊介, 志賀元紀, ”スペクトラムイメージデータのノイズ処理と信号抽出の最近の進展”,顕微鏡, 55, 60-64 (2020)




2019
Peer-reviewed

[1]  D. Negi, J. Spiegelberg, S. Muto, T. Thersleff, M. Ohtsuka, L. Schönström, K. Tatsumi, J. Rusz, “Proposal for measuring magnetism with patterned apertures in a transmission electron microscope” Phys. Rev. Lett. 122, 037201 (2019)

[2]  K. Oguni, K. Sato, Y. Ishikawa, S. Kawasaki, A. Vasin, S. Muto, “Analysis of evolution of electron-radiation-induced defects in white-luminescent, carbonized,mesoporous silica nanocomposite using transmission electron microscopy/cathodoluminescence” Nuclear Inst. and Methods in Physics Research B, 439, 22-33 (2019)

[3]  S. Muto, S. Arai, T. Higuchi, K. Orita, S. Ohta, H. Tanaka, T. Suganuma, M. Ibe, H. Hirata, “Environmental high-voltage S/TEM combined with a quadrupole mass spectrometer for concurrent in situ structural characterization and detection of product gas molecules associated with chemical reactions” Microscopy, 68, 185-188 (2019)

[4]  S. Muto, J. Spiegelberg, M. Shiga, M. Ohtsuka, J. Rusz, “Mining physical/chemical properties from nano-scale areas using STEM spectroscopic methods and informatics techniques” Proceedings of 10th Pacific Rim International Conference on Materials and Processing, PRICM10, Xi’an, Aug.18-22 (2019) pp.720-729.

[5]  M. Shiga, S. Muto, “Non-negative matrix factorization and its extensions for spectral image data analysis” e-Journal of Surface Science and Nanotechnology, 17, 148-154 (2019)

[6]  Y. Yamamoto, Y. Iriyama, S. Muto, “STEM-EELS analysis of the interface structures of composite ASS-LIB electrodes fabricated via aerosol deposition” Journal of the American Ceramic Society, 103, 1454-1462 (2019) DOI:10.1111/jace.16813

[7]  Z. Zhang, I. Karimata, H. Nagashima, S. Muto, K. Ohara, K. Sugimoto, T. Tachikawa, “Interfacial oxygen vacancies yielding long-lived holes in hematite mesocrystal-based photoanodes” Nature Communications, 10, 4832, (2019) DOI:10.1038/s41467-019-12581-z

[8]  A.V. Vasin, S. Muto, Y. Ishikawa, D. V. Kysil, S. V. Sevostianov, O. F. Isaieva, G. Yu. Rudko, R. Yatskiv, S. Starik, V. A. Tertykh, A. N. Nazarov, V. S. Lysenko, “Evolution from UV emission of phenyl groups to visible emission of pyroltic nanocabons dispersed in fumed silica: Alternative insight into photoluminescence of carbon nanodots” Journal of Luminescence, 219, 116926 (2019) DOI:10.1016/J. Jlumin.2019.116926

[9]   T. Thersleff, L. Schönström, C. W. Tai, R. Adam, D. E. Bürgler, C. M. Schneider, S. Muto, J. Rusz, “Single-pass STEM-EMCD on a zone axis using a patterned aperture: progress in experimental and data treatment methods” Scentific Reports, 9, 18170 (2019)

Books, commentaries and reviews, etc.

[1]      大塚真弘, 武藤俊介, ”電子チャネリング効果を利用した結晶材料定量分析法の現状”,日本金属学会会報「まてりあ」58, 73-76 (2019)

[2]      武藤俊介, 荒井重勇, 樋口哲夫, 大田繁正, 折田浩二, ”反応科学超高圧電子顕微鏡と四重極質量分析計による新しいオペランド測定システム開発”,日本電子news創立70周年記念号, 51, 5-9 (2019)

[3]      伊神洋平, 武藤俊介, 三宅亮, ”電子チャネリングを用いたサイト選択的分光分析:ケイ線石のAl/Si 秩序度の例”,日本結晶学会誌, 61, 75-76 (2019)

[4]S. Muto, S. Arai, T. Higuchi, S. Ohta, K. Orita, ”Development of new operando measurement system by combined reaction-science high-voltage electron microscopy and quadrupole mass spectrometry” JEOL News, 54(1), 35-39 (2019)


2018
Peer-reviewed

[1]  Y. Takahashi, I. Ashida, S. Arai, K. Higuchi, Y. Yamamoto, S. Muto, “Interfacial fracture strength evaluation of Cu/SiN micro-components: applicability of the linear fracture mechanics criterion under a hydrogen envionment” International Journal of Fracture, 210, 223-231 (2018)

[2]  D. Savchenko, A. Vasin, S. Muto, E. Kalabukhova, A. Nazarov, “EPR Study of Porous Si:C and SiO2 :C Layers” Phys. Status Solidi B 2018, 1700559 (2018)DOI: 10.1002/pssb.201700559

[3]  M. Hashimoto, T. Ogawa, S. Kitaoka, S. Muto, M. Furuya, H. Kanetaka, M. Abe, H. Yamashita, “Control of Surface potential and hydroxyapatite formation on TiO2scales containing nitrogen-reated defects” Acta Materialia, 155, 379-385 (2018)DOI: 10.1016/j.actamat.2018.05.072

[4]  Y. Yamamoto, M. Hattori, J. Ohyama, A. Satsuma, N. Tanaka, S. Muto, “Twinned/untwinned catalytic gold nanoparticles identified by applying a convolutional neural network to their Hough transformed Z-contrast images” Microscopy, (online) DOI: 10.1093/jmicro/dfy036

[5]  Y. Yamamoto, M. Ohtsuka, Y. Azuma, T. Takahashi, S. Muto, “Cation mixing in LiNi0.8Co0.15Al0.05O2 positive electrode material studied using high angular resolution electron channeling X-ray spectroscopy” Journal of Power Sources, 401, 263-270 (2018)

[6]  A. Seko, K. Toyoura, S. Muto, T. Mizoguchi, S. Broderick, “Progress in nanoinformatics and informational materials science” MRS Bulletin, 43, 690-695 (2018)

[7]  M. Hashimoto, T. Ogawa, S. Kitaoka, S. Muto, M. Furuya, H. Kanetaka, M. Abe, H. Yamashita, “MC3T3-E1 Cellular Response and Protein Detection on Surface Potential-Controlled TiO2 Scale in Serum-Containing Medium” Key Engineering Materials, 782, 218-223 (2018)

Books, commentaries and reviews, etc.

[1]      武藤俊介, ”ライフサイエンス顕微鏡学ハンドブック”,3.1 X線分析, 3.2 電子エネルギー損失分光法(EELS), 朝倉書店, (2018)

[2]      M. Shiga, S. Muto, ”High Spatial Resolution Hyperspectral Imaging with Machine-Learning Techniques, ” Nanoinformatics., Springer, Singapore (2018)

2017
Peer-reviewed

[1]  H. Inoue, S. Muto, S. Arai, H. Wasada, N. Umehara, “Microscopic origin of Ultra-low friction coefficient between the wear track formed on carbon nitride coating and transfer layer on sliding ball in friction tests under dry N2” Surface & Coatings Technology, 313, 31-39 (2017)DOI: 10.1016/j.surfcoat.2017.01.048

[2]F. Gualandris, S. B. Simonsen, J. B. Wagner, S. Sanna, S. Muto, L. Theil Kuhn, , “In situ TEM analysis of a Symmetric solid oxide cell in oxygen and vacuum-cation diffusion observations” ECS Transactions, 75(42), 123-133 (2017)DOI: 10.1149/07542.0123ecst

[3]  S. Muto, K. Tatsumi, “Detection of local chemical states of lithium and their spatial mapping by scanning transmission electron microscopy, electron energy-loss spectroscopy and hyperspectral image analysis” Microscopy, 39-49 (2017)DOI: 10.1093/jmicro/dfw038

[4]  J. Rusz, J. Spiegelberg, S. Muto, T. Thersleff, M. Ohtsuka, K. Leifer, P. M. Oppeneer, “Localization of magnetic circular dichroic spectra in transmission electron microscopy experiments with atomic plane resolution” Phys. Rev. B95, 174412 (2017)DOI: 10.1103/PhysRevB.95.174412

[5]  S. Muto, M. Ohtsuka, “High-precision quantitative atomic-sitye-analysis of functional dopants in crystalline materials by electron-channelling-enhanced microanalysis” Progress in Crystal Growth and Characterization of Materials, 63, 40-61 (2017)DOI: 10.1016/j.pcrysgrow.2017.02.001

[6]  T. Thersleff, S. Muto, M. Werwinski, J. Spiegelberg, Y. Kvashnin, B. Hjörvarsson, O. Eriksson, J. Rusz, K. Leifer, “Towards sub-nanometer real-space observation of spin and orbital magnetism at the Fe/MgO interface, Scientific Reports, 7, 44802 (2017) DOI: 10.1038/srep44802

[7]  J. Spiegelberg, S. Muto, M. Ohtsuka, K. Pelckmans, J. Rusz, “Unmixing hyperspectral data by using signal subspace sampling” Ultramicroscopy, 182, 205-211 (2017)DOI: 10.1016/j.ultramic.2017.07.009

[8]  高橋知里,武藤俊介,山本浩充,”形態観察結果に基づくバイオフィルム感染症治療用高分子ナノ粒子製剤の設計”,医学生物学電子顕微鏡技術学会誌,31, (2017)

[9]  高橋可昌,荒井重勇,樋口公孝,山本悠太,武藤俊介,宅間正則,齋藤賢一,佐藤知広,”マイクロ要素における界面端からの剥離き裂発生強度(水素環境の影響)”,日本機械学会2017度年次大会講演論文集(2017)

[10]  M. Hashimoto, S. Kitaoka, Y. Obata, S. Muto, T. Ogawa, M. Furuya, H. Kanetaka, “Control of HAp formation and osteoconductivity on nitrogen-doped TiO2 scale formed by oxynitridation of Ti” Key Engineering Materials, 758, 86-89 (2017)DOI: 10.4028/www.scientific.net/Kem.758.86

[11]  S. Muto, M. Ohtsuka, “High-precision Quantitative atomic-site-analysis of functional dopants in crystalline materials by electron-channelling-enhanced microanalysis” Progress in Crystal Growth and Characterization of Materials, 63, 40-61 (20017)DOI: 10.1016/j.pcrysgrow.2017.02.001

Books, commentaries and reviews, etc.

[1]      武藤俊介, J. Rusz, ”ナノ電子プローブによる磁気カイラル二色性(EMCD)測定”,顕微鏡,52, 82-89 (2017)

2016
Peer-reviewed

[1]  J. Rusz, S. Muto, J. Spiegelberg, R. Adam, K. Tatsumi, D. E. Burgler, P. M. Oppeneer, C. M. Schneider, “Magnetic measurements with atomic-plane resolution” Nature Communications, 7, 12672 (2016) DOI: 10.1038/ncomms/12672

[2]  Y. Yamamoto, K. Kataoka, J. Akimoto, K. Tatsumi, T. Kousaka, J. Ohnishi, T. Takahashi, S. Muto, “Quantitative analysis of cation mixing and local valence states in LiNixMn2-xO4 using concurrent HARECXS and HARECES measurements” Microscopy, 65, 253-262 (2016) DOI: 10.1093/jmicro/dfw008

[3]   Y. Takahashi, H. Kondo, K. Aihara, M. Takuma, K. Saitoh, S. Arai, S. Muto, Y. Yamamoto, K. Higuchi, N. Tanaka, “Interfacial fracture strength of micro-scale Si/Cu components with different free-edge shape” Key Engineering Materials, 665, 169-172 (2016)DOI: 10.4028/www.scientific.net/KEM.665.169

[4]    M. Ohtsuka, S. Muto, K. Tatsumi, Y. Kobayashi, T. Kawata, “Quantitative determination of occupation sites trace Co substituted for multiple Fe sites in M-type hexagonal ferrite using statistical beam-rocking TEM-EDXS analysis” Microscopy, 65, 127-137 (2016)DOI: 10.1093/jmicro/dfv356

[5]    Y. Yamamoto, Y. Iriyama, S. Muto, “Union operation image processing of data cubes separately processed by different objective filters and its application to void analysis in an all-solid-state lithium-ion battery” Microscopy, 65, 191-198 (2016)DOI: 10.1093/jmicro/dfv373

[6]    M. Hashimoto, S. Kitaoka, S. Muto, K. Kazuyoshi, Y. Obata, “The microstructure of scale formed by oxynitriding of Ti and exhibiting significant apatite-forming ability” Journal of Materials Research, 31, 1004-1011 (2016) DOI: 10.1557/jmr.2016.79

[7]    Y. Takahashi, H. Kondo, R. Asano, S. Arai, K. Higuchi, Y. Yamamoto, S. Muto, N. Tanaka, “Direct evaluation of grain boundary hydrogen embrittlement: a micro-mechanical approach” Materials Science & Engineering A, 661, 211-216 (2016) DOI: 10.1016/j.msea.2016.03.035

[8]    G. Shimura, K. Niwa, Y. Shirako, S. Muto, K. Kusaba, M. Hasegawa, “Multicomponent A-site Ordered Perovskite BiMn3(Fe0.25Ti0.75)4O12: High-Pressure Synthesis, Crystal Chemistry and Magnetic Behavior” Solid State Communications, 234-235, 40-44 (2016) DOI: 10.1016/j.ssc.2016.03.004

[11]  C. Takahashi, S. Muto, H. Yamamoto, “A microscopy method for scanning transmission electron microscopy imaging of the antibacterial activity of polymeric nanoparticles on a biofilm with an ionic liquid” Journal of Biomedical Materials Research Part B:Applied Biomaterials, (online) DOI:10.1002/jbm.b.33680

[12]    M. Shiga, K. Tatsumi, S. Muto, K. Tsuda, Y. Yamamoto, T. Mori, T. Tanji, “Sparse modeling of EELS and EDX spectral imaging data by nonnegative matrix factorization” Ultramicroscopy, 170, 43-59 (2016)DOI: 10.1016/j.ultramic.2016.08.006

[13]    H. Inoue, S. Muto, X. Deng, S. Arai, N. Umehara, “Structure analysis of topmost layer of CNxafter repeated sliding using scanning transmission electron microscopy electron energy-loss spectroscopy” Tin Solid Films, 616, 134-140 (2016)DOI: 10.1016/j.tsf.2016.08.014

[14]    M. Shiga, S. Muto, K. Tatsumi, K. Tsuda, “Matrix factorization for automatic chemical mapping from electron microscopic spectral imaging datasets” Transactions of the Materials Research Society of Japan, 41, 333-336 (2016)

[15]  I. Maruyama, S. Muto, “Change in relative density of natural rock minerals due to electron irradiation” Journal of Advanced Concrete Technology, 14, 706-716 (2016)

Books, commentaries and reviews, etc.

[1]      荒井重勇, 高橋可昌, 網野岳文, 吉田要, 山本悠太, 樋口公孝, 山本剛久, 武藤俊介, ”反応科学超高圧電子顕微鏡を用いたガス環境その場観察”,金属,86, 12, 17-22 (2016)

[2]   武藤俊介,志賀元紀, ”スペクトルイメージデータ解析への統計・情報処理”,表面科学, 37, 12, 610-615 (2016) 特集「最新の化学・物理イメージング」


2015

Peer-reviewed

[1]      Y. Takahashi, H. Kondo, R. Asano, M. Takuma, K. Saitoh, S. Arai, S. Muto, N. Tanaka, “In situ micro-mechanical testing of grain boundaries combined with environmental TEM” Experimental Mechanics

[2]      Y. Honda, S. Muto, K. Tatsumi, H. Kondo, K. Horibuchi, T. Kobayashi, T. Sasaki, “Microscopic mechanism of path-dependence on charge-discharge history in lithium iron phoshate cathode analysis using scanning transmission electron microscopy and electron energy-loss spectroscopy spectral imaging” Journal of Power Sources, 291, 85-94 (2015)

[3]    T. Takahashi, S. Arai, Y. Yamamoto, K. Higuchi, H. Kondo, Y. Kitagawa, S. Muto, N. Tanaka, “Evalution of Interfaial Fracture Strength in Micro-Scale Components Combined with High-Voltage Environmental Electron Microscopy” Experimental Mechanics, 55, 1047-1056 (2015)

[4]    J. Senga, K. Tatsumi, S. Muto, T. Yoshida, “Effects of nitrogen-related defects on visible light photocatalytic response in N+ implanted TiO2: A first-principles study” Journal of Applied Physics, 118, 115702 (2015)DOI: 10.1063/1.4930811

Books, commentaries and reviews, etc.

[1]      武藤俊介,志賀元紀,巽一厳,津田宏治,”ナノ電子顕微分光における情報処理技法の応用”,日本セラミックス協会「セラミックス」,vol. 50, no.7, 527-530 (2015)


2014
Peer-reviewed

[1]      A. H. Tavabi, S. Arai, S. Muto, T. Tanji, R. E. Dunin-Borkowski, “In situ Transmission Electron Microscopy of Ionic Conductivity and Reaction Mechanisms in Ultrathin Solid Oxide Fuel Cells” Microscopy and Microanalysis 20, 1817 (2014)

[2]      S. Suzuki, K. Niwa, A. Honda, S. Muto, A. Ando, M. Hasegawa , “High-pressure synthesis and Sn valence state analysis of BaTiO3–SnO solid solution” J. Mater. Res., 2014 online: 21 Oct 2014 DOI: 10.1557/jmr.2014.293

[3]     N. Tanaka, J. Usukura, M. Kusunoki, Y. Saito, K. Sasaki, T. Tanji, S. Muto, S. Arai, “Development of an environmental high voltage electron microscope and its application to nano and bio-materials” J. Phys.: Conference Series, 522, 12008 (2014)

[4] K. Niwa, K. Suzuki, S. Muto, K. Tatsumi, K. Soda, T. Kikegawa and M. Hasegawa, “Discovery of the Last Remaining Binary Platinum-Group Pernitride RuN2”, Chemistry-A European Journal, 20, 13885 (2014). DOI: 10.1002/chem.201404165

[5]      T. Yoshida, E. Kuda, S. Muto, “Depth distribution of dopant effective for visible-light response in nitrogen-doped TiO2 photocatalyst”, Surface and Interface Analysis, 46, 1236 (2014). DOI: 10.1002/sia.5542.

[6]      K. Niwa, H. Ikegaya, T. Taguchi, S. Muto, T. Tokunaga and M. Hasegawa, ”Growth of rectangular hollow tube crystals with rutile-type structure in supercritical fluids”, J. Physics: Conf.Ser. 500 (2014) 022007 doi:10.1088/1742-6596/500/2/022007 18th APS-SCCM and 24th AIRAPT

[7]   S. Muto, J. Rusz, K. Tatsumi, R. Adam, S.Arai, V. Kocevski, P.M.Oppeneer, D.E.Burgler and C.M.Schneider, "Quantitative characterization of nanoscale polycrystalline magnets with electron magnetic circular dichroism" Nature Communications,vol. 5, 3138 (2014)

[8]    Y. Kotaka, T. Yamazaki, M. Ohtsuka, K. Watanabe,"Image formation mechanisms of spherical aberration corrected BF STEM imaging methods" Ultramicroscopy,Vol. 136, pp.119-126 (2014)

[9]    K. Tatsumi, S. Muto, J. Rusz, T. Kudo, S. Arai, "Signal enhancement of electron magnetic circular dichroism by ultra-high-voltage TEM, toward quantitative nano-magnetism measurements" Microscopy 63, pp.243-247 (2014)

Books, commentaries and reviews, etc.

[1]      武藤俊介,巽一厳,Jan Rusz, ”電子磁気円二色性によるナノ領域磁気モーメントの測定”,日本結晶学会誌,vol. 56, no.5, 387-392 (2014)

[2]      S. Muto et al, “Qualitative characterization of magnetic materials based on electron magnetic circular dichroism with nanometric resolution using the JEM-1000K RS ultra-high voltage STEM”, JEOL News, vol. 49, No. 1, pp.21-28 (2014)

[3]      武藤俊介ら,”電子磁気円二色性に基づく磁性材料の定量分析-超高圧走査透過型電子顕微鏡JEM-1000K RSによるナノ分解能測定へ”,日本電子news,vol. 46, no.1, pp.9-16 (2014)


Return to top


2013
Peer-reviewed

[1]    K.Tatsumi, S. Muto, J.Rusz, "Energy Loss by Channeled Electrons: A Quantitative Study on Transition Metal Oxides" Microscopy and microanalysis,vol. 19, pp.1586-1594 (2013)

[2]    A. H. Tavabi, S. Muto, T. Tanji, R. E. Dunin-Borkowski, "In situ study of anode reaction in intermediate temperature solid oxide fuel cells" Microscopy and Microanalysis vol. 19, S2, pp.494-495(2013)

[3]    M. Ohtsuka, T. Yamazaki, Y. Kotaka, H. Fujisawa, M. Shimizu, K. Honda, I. Hashimoto, K. Watanabe, "Nonlocality in spherical-aberration-corrected HAADF STEM images" Acta Crystallographica Section, vol. A 69, pp.289-296 (2013)

[4]    T. Yamazaki, M. Ohtsuka, Y. Kotaka, K. Watanabe,"Bloch wave simulations in the frozen lattice approximation", Ultramicroscopy, Vol. 135, pp. 16-23 (2013)

[5]    S. Muto K. Tatsumi and J. Rusz, "Parameter-free extraction of EMCD from an energy-filtered diffraction datacube using multivariate curve resolution" Ultramicroscopy ,125, 89-96, 2013

[6]    J. Rusz, S. Muto and K. Tatsumi, “New algorithm for efficient Bloch-waves calculations of orientation-sensitive ELNES” Ultramicroscopy , 125,81-88,Feb.2013

[7]    N. Tanaka, J.Usukura, M.Kusunoki, Y.Saito, K.Sasaki, T.Tanji, S.Muto and S.Arai “Development of an environmental high-voltage electron microscope for reaction science” Microscopy,62(1) , 205-215, Feb ,2013

Return to top


2012
Peer-reviewed

[1]    S. Muto, K. Tatsumi, Y. Kojima, H. Oka, H. Kondo, K. Horibuchi and Y. Ukyo, “Effect of Mg-doping on the degradation of LiNiO2-based cathode materials by combined spectroscopic methods” J. Power Sources 205,449-455, May. 2012.

[2]    Y. Ishikawa , K. Sato, S. Kawasaki, Y. Ishii, A. Matsumura and S. Muto, “White light emission from amorphous silicon-oxycarbide materials” Phys. Stat. Sol.,A 209, 1022-1025, Jun. 2012.

[3]    K. Sato, Y. Ishikawa, Y. Ishii, S. Kawasaki, S. Muto and Y. Yamamoto, “Effect of Synthesis Process on Luminescence Properties and Structure of Mesoporous Carbon-Silica Nanocomposite” Jpn. J. Appl. Phys., 51, 082402-1-5, Jul. 2012.

[4]    T. Harada, I. Ohkubo, M. Lippmaa, Y. Sakurai, Y. Matsumoto, S. Muto, H. Koinuma and M. Oshima, “Spin-filter tunnel junction with matched Fermi surfaces” Phys. Rev. Lett., 109, 076602-1-5, Aug. 2012.

[5]    T. Harada, I. Ohkubo, M. Lippmaa, Y. Sakurai, Y. Matsumoto, S. Muto, H. Koinuma and M. Oshima, “Large Tunnel Magnetoresistance in Epitaxial Oxide Spin-Filter Tunnel Junctions” Adv. Func. Mater., 21,4471-4475, 2012.

[6]    K. Tatsumi, S. Muto, K. Ikeda and S. Orimo, “Chemical Bonding of AlH3 Hydride by Al- 2,3 Electron Energy-Loss Spectra and First-Principles Calculations” Materials, vol. 5pp.566-574 (2012)

Books, commentaries and reviews, etc.

[1]    巽一厳,武藤俊介,近藤広規,佐々木厳,右京良雄“電子顕微鏡分光と第一原理計算によるリチウム電池正極の機能元素電子状態解析”日本セラミックス協会「セラミックス」: 特集「機能元素が拓く新しいセラミックスの世界」47,528-533,Jul. 2012.

[2]    武藤俊介 “多変量スペクトル解析によるナノ物性マッピング” 日本金属学会会報「まてりあ」51, 415-422, Sep. 2012.

[3]   武藤俊介“STEM-EELS多変量解析を用いたLi化学状態マッピング”顕微鏡 472012 127-130

Return to top


2011
Peer-reviewed

[1]    S. Muto, Y. Fujimichi, K. Tatsumi, H. Yamane and T. Kawano, “Site occupancy determination of Eu/Y doped in Ca2SnO4 phosphor by electron channeling microanalysis” Optical Materials 33, 1015-1018, 2011.

[2] A. V. Vasin, S. Muto, Y. Ishikawa, J. Salonen, A. N. Nazarov and V. S. Lysenko, “Attribution of white-light emitting centers with carbonized surface in nano-structured SiO2:C layers” Thin Solid Films 519, 4008-4011, 2011.

[3]    H. Tokoro, S. Fujii, Y. Kobayashi and S. Muto, “The growth of carbon coating layers on iron particles and the effect of alloying the iron with silicon” J. Alloys and Compounds 509, 1378-1383, 2011.

[4]    A. V. Vasin, S. Muto, Y. Ishikawa, A. V. Rusavsky, T. Kimura, V. S. Lysenko and A. N. Nazarov, “Comparative study of annealing and oxidation effects in a-SiC:H and a-SiC thin films deposited by radio-frequency magnetron sputtering” Thin Solid Films 519, 2218-2224, 2011.

[5]    R. Nomura, H. Ozawa, S. Tateno, K. Hirose, J. Hernlund, S. Muto, H. Ishii and N. Hiraoka, “Spin crossover and iron-rich silicate melt in the Earth’s deep mantle” Nature473, 199-202, 2011.

[6]. Y. Kojima, S. Muto, K. Tatsumi, H. Kondo, H. Oka, K. Horibuchi and Y. Ukyo, “Degradation analysis of a Ni-based layered positive-electrode active material cycled at elevated temperatures studied by scanning transmission electron microscopy and electron energy-loss spectroscopy”, J. Power Sources 196, 7721-7727, 2011.

[7]. R. Sinmyo, K. Hirose, S. Muto, Y. Ohishi and A. Yasuhara, “The valence state and partitioning of iron in the Earth’s lowermost mantle”, Jornal of Geophysical Research116, B07205-1-9, 2011

[8]J. Yuhara, D. Tajima, T. Matsui, K. Tatsumi, S.Muto, M. Schmid and P. Varga“Growth and structure of an ultrathin tin oxide film on Rh(111)”, J.Appl.Phys. 109, 024903, 2011.

Books, commentaries and reviews, etc.

[1]    池田一貴,大友季哉,武藤俊介,折茂慎一,“アルミニウム水素化物の合成および原子配置と水素放出特性”Ceramics Japan, 46, 174-177, 2011.

[2]    武藤俊介,“各信号処理・統計的手法の電子顕微鏡データへの応用” 顕微鏡46, 24-29, 2011.

[3]   吉田朋子,武藤俊介,“ 放射光・電子分光法融合による触媒活性種の化学状態解析”触媒, Vol.53, No.4, 228-234, 2011 

[4]   田中信夫,臼倉治朗,楠美智子,斎藤弥八,佐々木勝寛,丹治敬義,武藤俊介,荒井重勇,“反応科学超高圧電子顕微鏡の開発”顕微鏡 46156-159, 2011 

Return to top


2010
Peer-reviewed

[1]    S. Muto, K. Tatsumi, T. Sasaki, H. Kondo, T. Ohsuna, K. Horibuchi and Y. Takeuchi, “Mapping of heterogeneous chemical states of lithium in a LiNiO2-based active material by electron energy-loss spectroscopy. ” Electrochem Solid-State Lett.13, A115-A117, 2010.

[2]    K. Tatsumi, S. Muto, I. Nishida and J. Rusz“Site-specific electronic configurations of Fe 3d states by energy loss by channeled electrons” Appl. Phys. Lett.96, 201911, 2010.

[3]    Y. Fujimichi, S. Muto, K. Tatsumi, T. Kawano and H. Yamane“Quantitative determination of site occupancy of multi-rare-earth elements doped into Ca2SnO4 phosphor by electron channeling microanalysis” J. Solid State Chem.183, 2127-2132, 2010.


Books, commentaries and reviews, etc.

[1]    S. Muto,“Microstructures and Reaction Mechanism of Aluminum Hydride”IMR KINKEN Research Highlightls 2010: Highlights of Collaborated Research, 46 (2010) 47.

Return to top


2009
Peer-reviewed

[1]    N. Enomoto, S. Muto, T. Tanabe, J. W. Davis and A. A. Haasz, “Grazing-incidence electron microscopy of surface blisters in single- and polycrystalline tungsten formed by H+, D+ and He+ irradiation” J. Nucl. Mater. 385 205,(2009) 606-614

[2]    T. Yoshida, S.Muto, L. Yuliati, H. Yoshida and Y. Inada, “Clustering of germanium atoms in silica glass responsible for the 3.1 eV emission band studied by optical absorption and X-ray absorption fine structure analysis” J. Nucl. Mater. 386-388(2009) 1010-1013

[3]    K. Ikeda, S.Muto, K. Tatsumi, M. Menjo, S. Kato, M. Bielmann, A. Zuttel, C. M. Jensen and S. Orimo, “Dehydriding reaction of AlH3: in-situ microscopic observations combined with thermal and surface analyses” Nanotechnology 20(2009) 204004 (4 pages)

[4]    S. Muto, T. Yoshida and K. Tatsumi “Diagnostic nano-analysis of materials properties by multivariate curve resolution applied to spectrum images by S/TEM-EELS” Mater. Trans. 50 (2009) 964-969

[5]    I. Nishida, K. Tatsumi and S.Muto, “Local electronic and atomic structures of Ce3+­-containing fluoride/oxide by TEM-EELS and first principles calculations” Mater. Trans. 50(2009) 952-958

[6]    T. Sasaki, T. Nonaka, H. Oka, C. Okuda, Y. Itou, Y. Kondo, Y. Takeuchi, Y. Ukyo, K. Tatsumi and S.Muto, “Capacity-fading mechanism of LiNiO2-based Lithium-ion batteries: I. Analysis by electrochemical and spectroscopic examination” J. Electrochem. Soc. 156(2009) A289-A293

[7]    S. Muto, Y. Sasano, K. Tatsumi, T. Sasaki, K. Horibuchi, Y. Takeuchi and Y. Ukyo, “Capacity-fading mechanism of LiNiO2-based Lithium-ion batteries: II. Diagnostic analysis by electron microscopy and spectroscopy” J. Electrochem  Soc. 156 (2009) A371-A377

[8]    K. Tatsumi and S. Muto, “Local electronic structure analysis by site-selective ELNES using electron channeling and first-principles calculations” J. Phys.: Condens. Matter. 21(2009) 104213 (14 pages)

[9]    T. Yoshida, S. Muto, L. Yuliati, H. Yoshida and Y. Inada, “Formation of germanium nanoparticles in silica glass studied by optical absorption and X-ray absorption fine structure analysis ” Nucl. Instr. and Meth. B 267 (2009) 1368-1371

[10]    K. Iwasaki, T. Yamamoto, H. Yamane, T. Takeda, S. Arai, H. Miyazaki, K. Tatsumi, M. Yoshino, T. Ito, Y. Arita, S.Muto, T. Nagasaki and T. Matsui, “Thermoelectric properties of Ba3Co2O6(CO3)0.7containing one-dimensional CoO6 octahedral columns” J. Appl. Phys. 106(2009) 034905 (5pages)

[11]    S. Muto, K. Tatsumi, K. Ikeda and S. Orimo, “Dehydriding process of a-AlH3 observed by transmission electron microscopy and electron energy-loss spectroscopy” J. Appl. Phys. 105 (2009) 123514 (4 pages)

Books, commentaries and reviews, etc.

[1]    武藤俊介,吉田朋子,巽一厳,“複合電子分光による機能元素分析”日本金属学会会報「まてりあ」,48,290-293,2009.

[2]   武藤俊介,巽一厳,“種々の電子状態評価技法の比較-ELNESに基づく化学結合性の議論-”顕微鏡 442009, 191-198

Return to top


2008
Peer-reviewed

[1]    T. Yoshida, S.Muto,“Chemical state analysis of implanted nitrogen in visible-light response TiO2 photo-catalyst” Trans MRS-Jpn.33 (2008) 339-344

[2]    K. Tatsumi, Y. Sasano, S. Muto, T. Yoshida, T. Sasaki, K. Horibuchi, Y. Takeuchi and Y. Ukyo, “Local atomic and electronic structures around Mg and Al dopants in LiNiO2 electrodes studied by XANES and ELNES and first-principles calculations” Phys. Rev. B,78, (2008) 045108

[3]    Y. Miyabe, T. Yoshida, S. Muto, T. Kiyobayashi and H. Wasada, “Hydrogen trapping state associated with the low-temperature TDS peak in hydrogenated nanostructured graphite” J. Appl. Phys., 104, (2008) 044311

[4]    Y. Sasano, S. Muto, “Energy drifts correction of electron energy-loss spectra for prolonged data accumulation of low SNR signals” J. Electron Microsc. 57, (2008) 149-158

[5]    Y. Ishikawa, A. V.  Vasin, J. Salonen, S.Muto, V. S. Lysenko, A. N. Nazarov, N. Shibata, and V.-P. Lehto, “Color Control of White Photoluminescence from Carbon Incorporated Silicon Oxide” J. Appl. Phys.,104(2008) 083522

Books, commentaries and reviews, etc.

[1]    吉田朋子,武藤俊介,“窒素イオン注入によるチタニア光触媒の可視光応答化” 日本金属学会会報「まてりあ」47, 642, 2008.

Return to top


2007
Peer-reviewed

[1]    K.Tatsumi, S. Muto, T.Yoshida, "Detection of hydrogen at localized regions by unoccupied electronic states in iron carbides: towards high spatial resolution mapping of hydrogen distributions" J. Appl. Phys.,101 (2007) 023523-1-7

[2]    Y. Yamamoto, K. Tatsumi and S. Muto, "Site-selective electronic structure of aluminum in oxide ceramics obtained by TEM-EELS analysis using the electron standing-wave method" Mater. Trans.48 (2007) 2590-2594

[3]    T. Yoshida, S. Muto and J. Wakabayashi, "Depth-resolved EELS and chemical state mapping of N+-implanted TiO2 photocatalyst" Mater. Trans.,48, (2007) 2580-2584

[4]    T. Yoshida, S. Muto and J. Wakabayashi,"Depth selective electronic state analysis of implanted nitrogen in visible-light response TiO2 photocatalyst", UMater. Sci. Forum, 561-565 (2007) 567-570

[5]    S. Muto, A. V. Vasin, Y. Ishikawa, N. Shibata, J. Salonen, and V.-P. Leht, "Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared    by Successive Thermal Carbonization/Oxidation of the Porous Silicon" Mater. Sci. Forum,561-565 (2007) 1127-1130

[6]    Y. Miyabe, T. Yoshida, S. Muto and T. Kiyobayashi, “Hydrogen Quasi-Chemically Trapped Between Defective Graphene Layers in Nanostructured Graphite” Mater. Sci. Forum , 561-565 (2007) 1585-1588

[7]    K. Tatsumi, Y. Yamamoto and S.Muto, “Site-by-site Electronic Structure Analysis of Al-containing Complex Compounds Using Channelling EELS and First Principles Calculations”Mater. Sci. Forum , 561-565 (2007) 2091-2094

Books, commentaries and reviews, etc.

[1]      武藤俊介,吉田朋子,”位置選択的電子エネルギー損失分光法によるナノ表面・界面電子状態測定とその空間分布の可視化”,表面,45, No.2, (2007) 27-38

Return to top


2006
Peer-reviewed

[1]    N. Enomoto, S. Muto, T. Tanabe, J. W. Davis and A. A. Haasz, “Intercalated hydrogen in nanostructured graphite studied with electron energy-loss spectroscopy and molecular orbital calculation” J. Alloys and Compounds, 413/1-2, (2006) 150-154

[2]    S. Arai, S.Muto, T. Sasaki, Y. Ukyo, K. Kuroda and H. Saka, “In-situobservation of reversible oxidation/reduction reactions in ceria-zirconia solid solution with Pt particles by transmission electron microscopy and electron energy-loss spectroscopy” Electrochem. Solid-State Lett.9 (2006) E1-E3

[3]    K. Tatsumi, S.Muto, Y. Yamamoto, H. Ikeno, S. Yoshioka and I. Tanaka, “Site-specific electronic structure analysis by channelling EELS and first principles calculations” Ultramicrosc. 106(2006) 1019-1023

[4]    S. Nakano, S. Muto and T. Tanabei “Change in Mechanical Properties of Ion-Irradiated Ceramics Studied by Nanoindentaion Method” Mater. Trans. 47 (2006) 112-121

[5]    M. Watanabe, T. Yoshida, T. Tanabe, S. Muto, A. Inoue and S. Nagata, “Observation of defect formation process in silica glasses under ion irradiation” Nucl. Instrum. And Methods in Phys. Res. Sec. B250 (2006) 174-177

[6]    H. Tokoro, S. Fujii, S, Muto and S. Nasu, “Fe-Co and Fe-Ni magnetic fine particles encapsulated by graphite carbon” J. Appl. Phys.99 (2006) 08Q512

[7]    S. Muto, Y. Sasano, K. Tatsumi, T. Sasaki, K. Horibuchi, Y. Takeuchi and Y. Ukyo, “Local Oxidation Induced by Inhomogeneous Stress on Blistered Si Surface” Jpn.J. Appl. Phys.45 (2006) 4179-4182

[8]    K. Tatsumi and S. Muto, “Spectral restoration and energy resolution improvement of electron energy-loss spectra by Pixon reconstruction: I. Principle and test examples” J. Electron Microsc. 55(2006) 215-223

[9]    S. Muto, K. Tatsumi, R. C. Puetter, T. Yoshida, Y. Yamamoto and Y. Sasano, “Spectral restoration and energy resolution improvement of electron energy-loss spectra by Pixon reconstruction: II. Application to practical ELNES analysis of low SNR”J. Electron Microsc. 55(2006) 225-230

Books, commentaries and reviews, etc.

[1]    武藤俊介,“電子エネルギー損失微細構造解析の軽元素分析への応用”顕微鏡 41(2006), 26-31

[2]   武藤俊介,巽一厳,“非等方PIXON法によるリチウムイオン二次電池材料の微量添加元素のEELS分析”日本金属学会会報「まてりあ」,45,(2006) p.869.

[3]   巽一厳,山本悠,武藤俊介,“スピネル型酸化物Mn3O4からのMn-L2,3電子線チャネリング条件下ELNES”日本金属学会会報「まてりあ」,45,(2006) p.874.

Return to top


2005
Peer-reviewed

[1]    S. Muto, H. Sugiyama, I. Yonenaga and T. Tanabe, “Structure of Oxygen-Related Defect Centers in of Ge1-xSix Alloys Studied by Extended Energy-Loss Fine Structure Analysis”J. Appl. Phys.44 (2005) 1892-1896

[2]    S. Nakano, S. Muto and T. Tanabe, “Irradiation-induced hardening/softening in SiO2studied with instrumented indentation” Mater. Sci. Eng. A, 400-401 (2005) 382-385

[3]    S.Muto, T. Kimura, T. Kiyobayashi, T. Tanabe and T. Maruyama, “Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy Analysis of Hydrogenated Nanostructured Graphite Prepared by Mechanical Milling” J. Appl. Phys.44 (2005) 2061-2069

[4]    S. Arai, S. Muto, T. Sasaki, K. Tatsumi, Y. Ukyo, K. Kuroda and H. Saka, “Novel valence state of cerium in Ce2Zr2O7.5 elucidated by electron energy-loss spectroscopy under electron channelling conditions” Solid State Commun. 135 (2005) 664-667

[5]    S. Dahra, A. Datta, S. Muto, C. T. Wu, K. H. Chen, Y. L. Wang, T. Tanabe, C. H. Shen, C. W. Hsu, L. C. Chen and T. Maruyama, “Mechanism of nanoblister formation in Ga+ self-ion implanted GaN nanowires” Appl. Phys. Lett.86 (2005) 203119-1-3

[6]    仲野伸祐,武藤俊介,田辺哲朗, “微小押し込み試験法によるセラミック材料のイオン照射に伴う力学特性変化” 日本金属学会誌,69 (2005) 815-824

[7]    S. Muto, and N. Enomoto, “Substructures of gas-ion-irradiation induced surface blisters in Si studied with cross-sectional transmission electron microscopy” Mater. Trans.46 (2005) 2117-2124

[8]    I. Yonenaga, M. Sakurai, M. H. F. Sluiter, Y. Kawazoe and S. Muto, “Atomistic structure and strain relaxation in Czochralski-grown SixGe1-x bulk alloys” J. Mater. Sci.: Mater. Electr. 16(2005) 429-432

[9]    A. Datta, S. Dhara, S.Muto, C. W. Hsu, C. T. Wu, C. H. Shen, T. Tanabe, T. Maruyama, K. H. Chen, L. C. Chen and Y. L. Wang, “Formation and in-situ dynamics of metallic nanoblisters in Ga+ implanted GaN nanowires” Nanotechnology16 (2005) 2764-2769

Books, commentaries and reviews, etc.

[1]    武藤俊介,“非金属材料におけるヘリウム照射損傷について”プラズマ・核融合学会誌, 81, No.1 (2005) 41-45.

[2]    武藤俊介,“TEM-EXELFS法の特徴とその応用の現状と展望”日本結晶学会誌,471 (2005) 61-66「特集−電子線で今何ができるか」

[3]    武藤俊介,巽一厳,“複合電子顕微分光への展望とその応用の可能性”日本セラミックス協会「セラミックス」, 11 (2005) 928-931, 特集「透過電子顕微鏡法の最前線とセラミックス」

[4]   荒井重勇,佐々木厳,右京良雄, 武藤俊介,黒田光太郎,坂公恭,“自動車排ガス浄化用助触媒-Ce2Zr2O7.5の高分解能像と電子エネルギー損失分光スペクトル”日本金属学会会報「まてりあ」,44 (12),(2005) 973

[5]   榎本成晃,武藤俊介,荒井重勇,田辺哲朗,A. A. Haasz,“D+照射により形成されたタングステン表面ブリスターの底角度入射電子顕微鏡観察”日本金属学会会報「まてりあ」,44 (12),(2005) 1005

Return to top


2004
Peer-reviewed

[1]    S. Muto, S. Dhara, A. Datta, C. W. Hsu, C. T. Wu, C. H. Shen, L. C. Chen, K. H. Chen, Y. L. Wang, T. Tanabe, T. Maruyama, H. M. Lin and C. C. Chen, “Characterization of nanodome on GaN nanowire formed with Ga ion irradiation” Mater. Trans.45 (2004) 435-439

[2]    S. Muto, H. Sugiyama, T. Kimura, T. Tanabe and T. Maruyama, “EXELFS/ELNES study of electron irradiation induced oxidation of a-SiC” Nucl. Instr. Meth. Phys. Res. B.218C (2004) 117-122

[3]    T. Yoshida, T. Tanabe, M. Hirano and S. Muto, “FT-IR study on the effect of OH ontent on the damaging process in silica irradiated by hydrogen” Nucl. Instr. Meth. Phys. Res. B.218C (2004) 202-208

[4]    荒井重勇, 武藤俊介,村井盾哉,佐々木厳,坂公恭, “電子エネルギー損失分光法によるセリア-ジルコニア固溶体の規則相の解析” 日本金属学会誌,68 (2004) 264-268

[5]    S. Arai, S. Muto, J. Murai, T. Sasaki, Y. Ukyo, K. Kuroda and H. Saka, “Valence Change of Cerium Ion associated with Redox reactions of Ceria-Zirconia Solid Solution by Electron Energy-Loss Spectroscopy Transmission Electron Microscopy and Electron” Mater. Trans.45 (2004) 2951-2955

[6]    T. Sasaki, Y. Ukyo, K. Kuroda, S. Arai, S. Muto, and H. Saka, “Crystal Structure of Ce2Zr2O7 and β -Ce2Zr2O7.5 J. Ceramic Soc. Jpn. 112(2004) 440-444

[7]    五十嵐慎一,板倉明子,北島正弘,中野伸祐,武藤俊介,田辺哲朗,山本博之,北條喜一, “ブリスタリングによる応力変調を利用した局所シリコン酸化の観察” 表面科学,25 (2004) 562-567

Books, commentaries and reviews, etc.

[1]    中野伸祐,榎本成晟,武藤俊介,田辺哲朗,“シリコン表面の水素イオン照射誘起ブリスターの非破壊構造解析と内部ガス圧評価”日本金属学会会報「まてりあ」,43 (12),(2004) 1008




MUTO Laboratory
Advanced Measurement Technology Center, Institute of Materials and Systems for Sustainability

Engineering Building No. 6 (Room No. 109-111) Furocho, Chikusa-ku, Nagoya 464-8601 JAPAN

TEL +81-52-789-4684
FAX +81-52-789-5137